All of the images on this page have been generated using Renishaw's inVia microRaman system powered by Renishaw's WiRE™ software. These examples represent only a limited selection of the comprehensive imaging capabilities available to users of these systems. Renishaw customers are invited to have their Raman images included in the gallery by contacting their local sales representative.

Pharmaceutical tablet
	Tablet dissolution behaviour correlated to distribution and concentration of tablet components Tablet from production batch 1 StreamLine™ Plus image showing the distribution of ingredients in a pharmaceutical tablet Map area: 6 mm x 12 mm Spectra generated: 82,000 Acquisition time: 38 minutes
	Tablet from production batch 2 StreamLine™ Plus image showing the distribution of ingredients in a pharmaceutical tablet Map area: 6 mm x 12 mm Spectra generated: 82,000 Acquisition time: 38 minutes
Multi-layered graphene sample
	Graphene monolayer, bilayer and other multiple-layer regions identified StreamLine™ Plus image showing the distribution of different thicknesses within a graphene flake Map area: 110 µm x 120 µm Spectra generated: 40,000 Acquisition time: 14 minutes
CVD diamond film
	Polished surface of polycrystalline diamond film grown by CVD technique Images show information on crystal shape, orientation, stresses and defect densities Map area: 175 µm x 88 µm Spectra generated: 51,200 Acquisition time: 2 imaging experiments, 15 minutes each (first acquisition used to generate three Raman images, second acquisition used to generate photoluminescence image) Image 1: Raman image showing 1 cm^-1 variation in position of the 1332 cm^-1 diamond band Image 2: Raman image showing 2 cm^-1 variation in width of the 1332 cm^-1 diamond band Image 3: Raman image showing variation in peak area of the 1332 cm^-1 diamond band Image 4: Photoluminescence image showing variation in the intensity of the 1.68 eV neutral silicon vacancy [Si-V]⁰ band
Micro indentation in silicon wafer
	Peak position Peak position derived from curve-fit analysis Map area: 10 µm x 10 µm Spectra generated: 10,000 Acquisition time: 36 minutes (single acquisition analysed for both images) Scan details: 100 nm step achieved using piezoelectic scanning stage
	Peak width Peak width derived from curve-fit analysis
Sandstone from Loch Torridon, Scotland
	StreamLine™ Plus image showing the distribution of Anatase (TiO₂) (red), Quartz (SiO₂) (green) and Haematite (Fe₂O₃) (blue) Area of section: 500 µm x 320 µm Spectra generated: 67,200 Acquisition time: 20 minutes
Polymer laminate (PS and PMMA)
	StreamLine™ Plus image of polymer laminate sample showing the distribution of PMMA (red), Epoxy (green) and PS (blue) Map area: 240 µm x 645 µm Spectra generated: 17,200 Acquisition time: 7 minutes
Strained S-Ge cross-hatch
	StreamLine™ Plus image of a Si-Ge semiconductor sample exhibiting a strained structure. The map shows variation in the Si-Si 510 cm^-1 band position (~0.2 cm^-1 positional band shift). The map data was generated using curve fitting. Map area: 129µm x 130µm Spectra generated: 55,000 Acquisition time: 13 minutes
Tooth section
	StreamLine™ Plus image of a sectioned tooth, highlighting the enamel (green), dentine (blue) and areas of high fluorescence (red) Map area: 9mm x 16mm Spectra generated: 84,000 Acquisition time: 20 minutes
Multilayred graphene sample

Laser induced crystalline silicon tracks
	StreamLine™ Plus image of laser induced crystalline silicon tracks on amorphous substrate Map area: 550µm x 550µm Spectra generated: 70,000 Acquisition time: 17 minutes
	Zoomed region (~ 250µm x 250µm) of above image

Next steps

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